High angle annular dark field-scanning transmission electron microscopy and high-resolution transmission electron microscopy studies in the Er2O3-ZrO2 system

Vacuum

Volumn 84, Issue 10, 2010, Pages 1226-1231

  Angeles Chavez, C ^a   Salas, P ^b   Lopez Luke, T ^c   de la Rosa, E ^c  

^a INSTITUTO MEXICANO DEL PETRÓLEO   (Mexico)

^b CENTRO DE FÍSICA APLICADA Y TECNOLOGÍA AVANZADA   (Mexico)

^c CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

Author keywords

Er; HAADF STEM; HR TEM; Nanocrystals; ZrO2

Indexed keywords

ANNEALING TEMPERATURES; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FACETED MORPHOLOGY; HAADF-STEM; HIGH-ANGLE ANNULAR DARK FIELDS; MONOCLINIC ZIRCONIA; NONIONIC; PLURONICS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SINGLE NANOCRYSTALS; SOL-GEL METHODS; TEM; WELL-DISPERSED;

CALCINATION; ELECTRIC FIELD MEASUREMENT; ELECTRONS; ERBIUM; GELS; NANOCRYSTALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM WELLS; SOL-GEL PROCESS; STRONTIUM COMPOUNDS; SURFACE ACTIVE AGENTS; X RAY SPECTROSCOPY; ZIRCONIA; ZIRCONIUM; ZIRCONIUM ALLOYS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 77953133464     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2009.10.030     Document Type: Article

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