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Volumn 256, Issue 20, 2010, Pages 5849-5855

Characterization of native and anodic oxide films formed on commercial pure titanium using electrochemical properties and morphology techniques

Author keywords

Anodic oxide films; EDX; Impedance (EIS); Native film; SEM; Titanium

Indexed keywords

AMORPHOUS FILMS; ANODIC OXIDATION; CORROSION RESISTANCE; CORROSIVE EFFECTS; ELECTROCHEMICAL CORROSION; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; TITANIUM; TITANIUM METALLOGRAPHY; TITANIUM OXIDES; X RAY ANALYSIS;

EID: 77953132861     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.03.058     Document Type: Article
Times cited : (75)

References (32)
  • 23
    • 77953127876 scopus 로고
    • Macdonald J.R. (Ed), John Wiley & Sons, New York, NY, USA (Chapter 4)
    • In: Macdonald J.R. (Ed). Impedance Spectroscopy (1987), John Wiley & Sons, New York, NY, USA (Chapter 4)
    • (1987) Impedance Spectroscopy


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.