Analysis of thickness dependence on the electrical properties of tin dioxide films in the presence of LPG gas

Journal of Alloys and Compounds

Volumn 500, Issue 1, 2010, Pages 49-55

  Ray, Sandipan ^a   Gupta, P S ^a   Singh, Gurdeep ^a  

^a ISMU   (India)

Author keywords

Sol gel processes; Thin films; X ray diffraction

Indexed keywords

COMPARATIVE ANALYSIS; DEPOSITED FILMS; ELECTRICAL PROPERTY; GAS SENSORS; INORGANIC SALTS; LAYERED FILMS; MULTI-LAYERED FILMS; OPTICAL STUDY; SEM; SOL-GEL METHODS; THICKNESS DEPENDENCE; TIN DIOXIDE FILM; TIN DIOXIDE THIN FILM; XRD;

CHLORINE COMPOUNDS; ELECTRIC PROPERTIES; GELS; NANOSTRUCTURED MATERIALS; PALLADIUM; SOL-GELS; SOLS; THIN FILMS; TIN; TIN DIOXIDE; TITANIUM COMPOUNDS; VAPOR DEPOSITION; X RAY DIFFRACTION;

SOL-GEL PROCESS;

EID: 77953129799     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.03.193     Document Type: Article

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