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Volumn , Issue , 2010, Pages 327-330
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A new approach for adaptive failure diagnostics based on emulation test: Concept and system architecture for a new way of boundary scan emulation based testing
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Author keywords
Adaptive systems; Automatic test equipment; Boundary scan testing; Field programmable gate arrays
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Indexed keywords
AUTOMATIC TEST EQUIPMENT;
BOUNDARY SCAN;
BOUNDARY-SCAN TESTING;
FAILURE DIAGNOSTICS;
NEW APPROACHES;
NEW CONCEPT;
NEW OPTIONS;
ON-BOARD RESOURCES;
PROGRAMMABLE LOGIC;
SPEED-UPS;
SYSTEM ARCHITECTURES;
TEST RESULTS;
AUTOMATIC TESTING;
LOGIC GATES;
ADAPTIVE SYSTEMS;
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EID: 77953109820
PISSN: 15301591
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (7)
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