Dynamic multiple-fault diagnosis with imperfect tests

IEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans

Volumn 39, Issue 6, 2009, Pages 1224-1236

  Ruan, Sui ^a,b   Zhou, Yunkai ^c   Yu, Feili ^a   Pattipati, Krishna R ^a   Willett, Peter ^a   Patterson Hine, Ann ^d  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b Department of Revenue Management and Planning ^*  (United States)

^c SOUTHERN METHODIST UNIVERSITY   (United States)

^d NASA AMES RESEARCH CENTER   (United States)

Author keywords

Approximate bayesian revision; Determinisitic simulated annealing; Dynamic fault diagnosis; Functional HMMMs; Hidden markov models (HMMs); Lagrangian relaxation; Multiple faults

Indexed keywords

APPROXIMATE BAYESIAN; APPROXIMATE BAYESIAN REVISION; DYNAMIC FAULT DIAGNOSIS; DYNAMIC FAULTS; LAGRANGIAN RELAXATION; MULTIPLE FAULTS;

ANNEALING; BAYESIAN NETWORKS; COMBINATORIAL OPTIMIZATION; COMPUTER SIMULATION; FAILURE ANALYSIS; FAULT DETECTION; HIDDEN MARKOV MODELS; LAGRANGE MULTIPLIERS; LARGE SCALE SYSTEMS; ONLINE SYSTEMS; SET THEORY; TESTING;

SIMULATED ANNEALING;

EID: 77952864548     PISSN: 10834427     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSMCA.2009.2025572     Document Type: Article

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