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Japanese Journal of Applied Physics

Volumn 48, Issue 8 Part 1, 2009, Pages 0855061-0855064

Thermoelectric properties of Bi2Te3-based thin films with fine grains fabricated by pulsed laser deposition

(6) Obara, Haruhiko a Higomo, Shun a,b Ohta, Michihiro a Yamamoto, Atsushi a Ueno, Kazuo a Iida, Tsutomu b

a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

b TOKYO UNIVERSITY OF SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BULK MATERIALS; C-AXIS ORIENTATIONS; DIMENSIONLESS FIGURE OF MERIT; ELECTRIC RESISTIVITY; FINE GRAINS; GRAIN SIZE; IN-PLANE; IN-PLANE DIRECTION; MEASUREMENT RESULTS; NANOSECOND PULSED LASER; QUARTZ GLASS SUBSTRATES; SUBSTRATE TEMPERATURE; THERMOELECTRIC PROPERTIES; THERMOREFLECTANCE; X-RAY DIFFRACTION MEASUREMENTS;

DEPOSITION; ELECTRIC CONDUCTIVITY; GLASS LASERS; LASER HEATING; OXIDE MINERALS; PULSED LASER DEPOSITION; QUARTZ; SUBSTRATES; TELLURIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION;

PULSED LASERS;

EID: 77952735026 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.48.085506 Document Type: Article

Times cited : (23)

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