|
Volumn 7, Issue 3-4, 2010, Pages 861-864
|
Structure and optical properties in the amorphous to crystalline transition in AgSbSe2 thin films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
AMORPHOUS-TO-CRYSTALLINE TRANSITION;
ANNEALED FILMS;
AS-DEPOSITED FILMS;
CHEMICAL COMPOSITIONS;
CRYSTALLINE PHASE TRANSITION;
DIELECTRIC CONSTANTS;
DISPERSION PARAMETERS;
EFFECTIVE MASS;
ELECTRON DIFFRACTION STUDY;
GLASS SUBSTRATES;
LIGHT INCIDENCE;
OPTICAL ABSORPTION SPECTRUM;
REFLECTION SPECTRA;
ROOM TEMPERATURE;
THERMAL-ANNEALING;
WAVELENGTH RANGES;
AMORPHOUS FILMS;
ANNEALING;
CARRIER CONCENTRATION;
CRYSTALLINE MATERIALS;
LIGHT ABSORPTION;
LIGHT REFLECTION;
LIGHT REFRACTION;
LIGHT TRANSMISSION;
OPTICAL TRANSITIONS;
PHASE TRANSITIONS;
REFRACTIVE INDEX;
REFRACTOMETERS;
SUBSTRATES;
THERMAL EVAPORATION;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
OPTICAL FILMS;
|
EID: 77952567804
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200982801 Document Type: Conference Paper |
Times cited : (12)
|
References (14)
|