Skewness variations of switching-current distributions in moderately damped Josephson junctions due to thermally induced multiple escape and retrapping

Journal of Physics: Conference Series

Volumn 150, Issue 5, 2009, Pages

  Fenton, J C ^a,b   Warburton, P A ^a,b  

^a LONDON CENTRE FOR NANOTECHNOLOGY   (United Kingdom)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

HIGHER ORDER STATISTICS; INTELLIGENT SYSTEMS; JOSEPHSON JUNCTION DEVICES; MONTE CARLO METHODS; TEMPERATURE DISTRIBUTION;

CROSSOVER TEMPERATURE; IV CHARACTERISTICS; OVERDAMPED; SUPERCURRENTS; SWITCHING CURRENTS; TEMPERATURE DEPENDENCE; THERMALLY ACTIVATED; THERMALLY INDUCED;

SWITCHING;

EID: 77952484157     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/150/5/052052     Document Type: Conference Paper

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