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Volumn 95, Issue 15, 2005, Pages

Collapse of thermal activation in moderately damped Josephson junctions

Author keywords

[No Author keywords available]

Indexed keywords

GATE VOLTAGE; THERMAL ACTIVATION; THERMAL ESCAPE; THERMAL FLUCTUATIONS;

EID: 28844485134     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.157002     Document Type: Article
Times cited : (87)

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