Direct observation of field-induced carrier dynamics in pentacene thin-film transistors by electron spin resonance spectroscopy

Japanese Journal of Applied Physics

Volumn 48, Issue 4 PART 2, 2009, Pages

  Matsui, Hiroyuki ^a,b   Hasegawa, Tatsuo ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSPORT; DIRECT OBSERVATION; ELECTRON SPIN RESONANCE; ESR SPECTRA; FIELD-INDUCED CARRIERS; GATE VOLTAGES; HIGH MOBILITY; IN-FIELD; INTERFACIAL CHARGE; LORENTZ; ORGANIC TFTS; ORGANIC TRANSISTOR; PENTACENE THIN-FILM TRANSISTORS; PENTACENES; RESIDENCE TIME; RESONANCE SPECTRUM; SPECTRAL LINE WIDTH;

ELECTRONS; LINEWIDTH; PARAMAGNETIC RESONANCE; RESONANCE; SEMICONDUCTING ORGANIC COMPOUNDS; SPIN DYNAMICS; THIN FILM TRANSISTORS;

ELECTRON SPIN RESONANCE SPECTROSCOPY;

EID: 77952473646     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.48.04C175     Document Type: Article

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