Influence of microstructure on local conductivities in La 0.7Ce0.3MnO3 thin film

Journal of Physics: Conference Series

Volumn 150, Issue 4, 2009, Pages

  RoBler S ^a   Jesudasan, J ^b   Bajaj, K ^b   Raychaudhuri, P ^b   Steglich, F ^a   Wirth, S ^a  

^a MAX PLANCK INSTITUTE FOR CHEMICAL PHYSICS OF SOLIDS   (Germany)

^b TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; DOPING (ADDITIVES); MANGANESE OXIDE; METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; MICROSTRUCTURE; PHASE SEPARATION; PULSED LASER DEPOSITION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR INSULATOR BOUNDARIES; SEPARATION;

AVERAGE GRAIN SIZE; ELECTRON-DOPED; LENGTH SCALE; LOCAL STRAINS; MANGANITE THIN FILMS; METALLIC STATE; SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY; SPATIALLY RESOLVED;

THIN FILMS;

EID: 77952467935     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/150/4/042164     Document Type: Conference Paper

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