New analysis methods for comprehensive understanding of random telegraph noise

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2009, Pages

  Nagumo, T ^a   Takeuchi, K ^a   Yokogawa, S ^a   Imai, K ^a   Hayashi, Y ^a  

^a RENESAS TECHNOLOGY CORP   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYSIS METHOD; BIAS DEPENDENCE; PRODUCT RELIABILITY; RANDOM TELEGRAPH NOISE; STATISTICAL BEHAVIOR; TIME LAG; WAVE FORMS;

ELECTRON DEVICES;

TELEGRAPH;

EID: 77952384660     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2009.5424230     Document Type: Conference Paper

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7. Z. Shi et al., IEEE Trans. Electron Devices, v. 41, n. 7, p. 1161, 1994.