Effect of ultraviolet radiation on slow-relaxation processes in ferroelectric capacitance structures

Journal of Applied Physics

Volumn 107, Issue 8, 2010, Pages

  Petrov, P K ^a   Alford, N McN ^a   Kozyrev, A ^b   Gaidukov, M ^b   Altynnikov, A ^b   Vasilevskiy, A ^b   Konoplev, G ^b   Tumarkin, A ^b   Gagarin, A ^b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b SAINT PETERSBURG ELECTROTECHNICAL UNIVERSITY LETI   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BOUGUER'S LAW; SHORTER WAVELENGTH; THIN-FILM CAPACITORS; THREE ORDERS OF MAGNITUDE; TIO; ULTRAVIOLET IRRADIATIONS; UV IRRADIATION;

BARIUM; CAPACITORS; FERROELECTRIC FILMS; FERROELECTRICITY; IRRADIATION; RELAXATION PROCESSES; THIN FILM CIRCUITS; ULTRAVIOLET RADIATION;

CAPACITANCE;

EID: 77952355678     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3327236     Document Type: Article

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