Structural characteristics of oriented mesostructured silica thin films

Langmuir

Volumn 26, Issue 10, 2010, Pages 7535-7539

  Xu, Fang Fang ^a   Cui, Fang Ming ^a   Ruan, Mei Ling ^a   Zhang, Lin Lin ^a   Shi, Jian Lin ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY STRUCTURE; CHANNEL DIRECTIONS; COINCIDENCE SITE LATTICES; FILM SURFACES; LATTICE DISPLACEMENT; LATTICE DISTORTIONS; MESOPOROUS FILMS; MESOPOROUS THIN FILMS; MESOSTRUCTURED SILICA; MICROSTRUCTURE EVOLUTIONS; ONE-DIMENSIONAL CHANNELS; ORIENTATION RELATIONSHIP; POTENTIAL APPLICATIONS; RESIDUAL INTERNAL STRESS; STRUCTURAL CHARACTERISTICS; STRUCTURAL DETAILS; STRUCTURAL FEATURE; TILT BOUNDARIES; TRANSMISSION ELECTRON MICROSCOPE;

GRAIN BOUNDARIES; SILICA; STRUCTURAL ANALYSIS; SYNTHESIS (CHEMICAL); THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

POLYCRYSTALLINE MATERIALS;

EID: 77952342943     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la904340m     Document Type: Article

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