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Volumn 81, Issue 4-5, 2010, Pages 1508-1512
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Atomic force microscopy investigation of the characteristic effects of silver ions on Escherichia coli and Staphylococcus epidermidis
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Author keywords
Atomic force microscopy; Escherichia coli; Silver ions; Staphylococcus epidermidis
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CELLS;
CYTOLOGY;
ESCHERICHIA COLI;
SILVER;
AFTER-TREATMENT;
ANTIMICROBIAL MECHANISMS;
BACTERIA STRAIN;
EXTERNAL STIMULATION;
METHODOLOGICAL APPROACH;
SILVER IONS;
STAPHYLOCOCCUS EPIDERMIDIS;
STRUCTURAL CHARACTER;
METAL IONS;
ANTIINFECTIVE AGENT;
ION;
SILVER;
ATOMIC FORCE MICROSCOPY;
BACTERIUM ADHERENCE;
CELL WALL;
CHEMICAL ANALYSIS;
CHEMISTRY;
CYTOPLASM;
DRUG EFFECTS;
ESCHERICHIA COLI;
MICROBIAL SENSITIVITY TEST;
PROCEDURES;
STAPHYLOCOCCUS EPIDERMIDIS;
TIME;
ANTI-BACTERIAL AGENTS;
BACTERIAL ADHESION;
CELL WALL;
CHEMISTRY TECHNIQUES, ANALYTICAL;
CYTOPLASM;
ESCHERICHIA COLI;
IONS;
MICROBIAL SENSITIVITY TESTS;
MICROSCOPY, ATOMIC FORCE;
SILVER;
STAPHYLOCOCCUS EPIDERMIDIS;
TIME FACTORS;
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EID: 77952319278
PISSN: 00399140
EISSN: None
Source Type: Journal
DOI: 10.1016/j.talanta.2010.02.061 Document Type: Article |
Times cited : (29)
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References (22)
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