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Volumn 80, Issue 16, 2008, Pages 6222-6227

Atomic force microscopy study of the effect of pulsed electric field on Staphylococcus epidermidis

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; BACTERIOLOGY; CELL MEMBRANES; ELECTRIC FIELD EFFECTS; ELECTRIC FIELDS; ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC FIELDS; FORCE MEASUREMENT; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY;

EID: 50049127617     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac800556f     Document Type: Article
Times cited : (18)

References (32)
  • 22
    • 50049109901 scopus 로고    scopus 로고
    • Luo,L. X.; P, L.; Zheng, S. P. Cell Engineering; South China University of Technology Press: Guangzhou, P. R. China, 2004; pp 109-110..
    • Luo,L. X.; P, L.; Zheng, S. P. Cell Engineering; South China University of Technology Press: Guangzhou, P. R. China, 2004; pp 109-110..


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.