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Volumn 53, Issue , 2010, Pages 380-381
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A 12b 22.5/45MS/s 3.0mW 0.059mm2 CMOS SAR ADC achieving over 90dB SFDR
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITOR MISMATCH;
CMOS TECHNOLOGY;
CONVERSION PROCESS;
DIGITAL BACKGROUND CALIBRATION;
KT/C NOISE;
LIMITING FACTORS;
NANO-METER REGIMES;
NON-IDEALITIES;
PERFORMANCE-LIMITING FACTORS;
PROCESS TECHNOLOGIES;
RADIX 2;
RAIL-TO-RAIL INPUT;
REFERENCE VOLTAGES;
SAMPLING SWITCHES;
SAR ADC;
SMALL CHIP AREA;
SUCCESSIVE APPROXIMATION REGISTER;
SWITCHING SPEED;
ANALOG TO DIGITAL CONVERSION;
CAPACITANCE;
CMOS INTEGRATED CIRCUITS;
ENERGY EFFICIENCY;
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EID: 77952137366
PISSN: 01936530
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISSCC.2010.5433830 Document Type: Conference Paper |
Times cited : (155)
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References (4)
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