A 1.1e- temporal noise 1/3.2-inch 8Mpixel CMOS image sensor using pseudo-multiple sampling

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 53, Issue , 2010, Pages 396-397

  Lim, Yong ^a   Koh, Kyoungmin ^a   Kim, Kyungmin ^a   Yang, Han ^a   Kim, Juha ^a   Jeong, Youngkyun ^a   Lee, Seungjin ^a   Lee, Hansoo ^a   Lim, Sin Hwan ^a   Han, Yunseok ^a   Kim, Jinwoo ^a   Yun, Jaecheol ^a   Ham, Seogheon ^a   Lee, Yun Tae ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS IMAGE SENSOR; COLUMN AMPLIFIERS; LOW NOISE; MULTIPLE SAMPLING; NOISE PERFORMANCE; NUMBER OF SAMPLES; POWER CONSUMPTION; READ-OUT CIRCUIT; READOUT TIME; SAMPLED DATA; SILICON AREA; SMALL PIXEL PITCH; TEMPORAL NOISE;

CMOS INTEGRATED CIRCUITS; DIGITAL CAMERAS; DIGITAL IMAGE STORAGE; IMAGE SENSORS; READOUT SYSTEMS;

PIXELS;

EID: 77952130964     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2010.5433971     Document Type: Conference Paper

References (7)

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3. H. Takahashi, et al., "A 1/2.7 inch Low-Noise CMOS Image Sensor for Full HD Camcorders," ISSCC Digest of Technical Papers, pp.510-618, Feb. 2007.
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7. D. Lee, G. Han, "High-speed, low-power correlated double sampling counter for column-parallel CMOS imagers," Electronics Letters, Vol.43, No.24, pp.1362-1364, Nov. 2007.