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Volumn 53, Issue , 2010, Pages 342-343

A 45nm SOI embedded DRAM macro for POWER7™ 32MB on-chip L3 cache

Author keywords

[No Author keywords available]

Indexed keywords

ASIC APPLICATION; DEEP TRENCH; DRAM DEVICES; DRAM MACRO; EMBEDDED DRAM; HIGH-PERFORMANCE MICROPROCESSORS; IMPROVING SYSTEMS; LOGIC TECHNOLOGY; OFF-CHIP; OFF-CHIP INTERFACES; ON CHIPS; PLANAR STRUCTURE; REDUCING COSTS; SEM; SENSE AMP; SOFT ERROR; SUPPLY NOISE; VOLTAGE ISLAND;

EID: 77952114330     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2010.5433814     Document Type: Conference Paper
Times cited : (27)

References (7)
  • 1
    • 0242636496 scopus 로고    scopus 로고
    • A 5.6-ns Random Cycle 144-Mb DRAM with 1.4Gb/s/pin and DDR3-RAM Interface
    • Nov.
    • H. Pilo, et al, "A 5.6-ns Random Cycle 144-Mb DRAM with 1.4Gb/s/pin and DDR3-RAM Interface", JSSC, Nov. 2003,.
    • (2003) JSSC
    • Pilo, H.1
  • 2
  • 3
    • 19344375866 scopus 로고    scopus 로고
    • Embedded DRAM: Technology Platform for Blue Gene/L Chip
    • Mar./May
    • S. Iyer, et al., "Embedded DRAM: Technology Platform for Blue Gene/L Chip", IBM J. Res.Dev., Mar./May, 2005.
    • (2005) IBM J. Res.Dev.
    • Iyer, S.1
  • 6
    • 77952171160 scopus 로고    scopus 로고
    • A 500MHz Random Cycle 1.5ns, SOI Embedded DRAM Macro
    • J. Barth, et al, "A 500MHz Random Cycle 1.5ns, SOI Embedded DRAM Macro", ISSCC 2007.
    • (2007) ISSCC
    • Barth, J.1
  • 7
    • 77952179383 scopus 로고    scopus 로고
    • Scaling Deep Trench Based eDRAM on SOI to 32nm and Beyond
    • G.Wang, et al, "Scaling Deep Trench Based eDRAM on SOI to 32nm and Beyond", IEDM 2008.
    • (2008) IEDM
    • Wang, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.