Effect of shock compression on single crystalline silicon

Journal of Physics: Conference Series

Volumn 215, Issue , 2010, Pages

  Kishimura, H ^a   Matsumoto, H ^a   Thadhani, N N ^b  

^a NATIONAL DEFENSE ACADEMY   (Japan)

^b Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

A-CENTER; COPPER SILICIDE; CRYSTALLINE SIZE; HIGH-PRESSURE PHASIS; POWDER XRD; SHOCK COMPRESSIONS; SINGLE CRYSTALLINE SILICON; XRD; XRD PATTERNS;

CRYSTALLINE MATERIALS; GERMANIUM; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICIDES; SINGLE CRYSTALS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

METASTABLE PHASES;

EID: 77951961347     PISSN: 17426588     EISSN: 17426596     Source Type: Journal    
DOI: 10.1088/1742-6596/215/1/012145     Document Type: Conference Paper

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