Kelvin probe force microscopy for conducting nanobits of NiO thin films

Nanotechnology

Volumn 21, Issue 21, 2010, Pages

  Son, J Y ^a   Shin, Y H ^b   Kim, H ^c   Cho, J H ^d   Jang, H ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b University of Ulsan   (South Korea)

^c Yonsei University   (South Korea)

^d Pusan National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AC BIAS; BISTABLE RESISTANCE; BOTTOM ELECTRODES; CONDUCTING ATOMIC FORCE MICROSCOPY; IMAGE CHARGES; KELVIN PROBE FORCE MICROSCOPY; NANOBITS; NEGATIVE POTENTIAL; NIO THIN FILM; RESISTIVE RANDOM ACCESS MEMORY; SI SUBSTRATES; UNIPOLAR SWITCHING;

ATOMIC FORCE MICROSCOPY; PLATINUM; PROBES; RANDOM ACCESS STORAGE; SILICON COMPOUNDS; THIN FILMS;

CONDUCTIVE FILMS;

EID: 77951814382     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/21/215704     Document Type: Article

References (14)

1. Gibbons J F and Beadle W E 1964 Switching properties of thin NiO films Solid-State Electron. 7 785-90
2. Asamitsu A, Tomioka Y, Kuwahara H and Tokura Y 1997 Current switching of resistive states in magnetoresistive manganites Nature 388 50 (Pubitemid 27283883)
3. Waser R and Aono M 2007 Nanoionics-based resistive switching memories Nat. Mater. 6 833-40 (Pubitemid 350064191)
4. Lee M-J et al 2007 Two series oxide resistors applicable to high speed and high density nonvolatile memory Adv. Mater. 19 3919
5. 3 thin films Appl. Phys. Lett. 92 133510
6. Ramesh R, Aggarwal S and Auciello O 2001 Science and technology of ferroelectric films and heterostructures for non-volatile ferroelectric memories Mater. Sci. Eng. R 32 191-236 (Pubitemid 32431947)
7. 2 cells Appl. Phys. Lett. 92 122910 (Pubitemid 351451666)
8. Nonnenmacher M, O'Boyle M P and Wickramasinghe H K 1991 Kelvin probe force microscopy Appl. Phys. Lett. 58 2921-3
9. Hofer W A, Foster A S and Shluger A L 2003 Theories of scanning probe microscopes at the atomic scale Rev. Mod. Phys. 75 1287
10. Mamin H J and Rugar D 1992 Thermomechanical writing with an atomic force microscope tip Appl. Phys. Lett. 61 1003-5
11. Son J Y, Kyhm K and Cho J H 2006 Surface charge retention and enhanced polarization effect on ferroelectric thin films Appl. Phys. Lett. 89 092907 (Pubitemid 44319970)
12. 3 Nat. Mater. 5 312-20
13. Son J Y and Shin Y H 2008 Direct observation of conducting filaments on resistive switching of NiO thin films Appl. Phys. Lett. 92 222106
14. 3 Appl. Phys. Lett. 93 023110