Characterization and preparation of focused laser beams

Optical Engineering

Volumn 47, Issue 1, 2008, Pages

  Kauert, Martin ^a   Frenz, Martin ^a   Rička, Jaro ^a  

^a UNIVERSITY OF BERN   (Switzerland)

Author keywords

diffraction; fiber optic sensors; focus; imaging; scanning microscopy

Indexed keywords

BEAM PROFILING; CMOS CAMERA; EFFECTIVE NUMERICAL APERTURE; FAR-FIELD; FIBER OPTIC TAPERS; FOCUSED LASER BEAMS; FOURIER SYNTHESIS; IN-PLANE; IN-SITU; OPTICAL INTERFACES; OPTIMAL BEAMS; PARAXIAL APPROXIMATIONS; POLARIZATION EFFECT; PROFILING SYSTEMS; SCANNING MICROSCOPY; WAVE VECTOR; WORKING MEDIUM;

CMOS INTEGRATED CIRCUITS; FOCUSING;

LASER BEAMS;

EID: 77951681475     PISSN: 00913286     EISSN: 15602303     Source Type: Journal    
DOI: 10.1117/1.2835692     Document Type: Article

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