Dependence of transverse and longitudinal resolutions on incident Gaussian beam widths in the illumination part of optical scanning microscopy

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 24, Issue 1, 2007, Pages 60-67

  Chon, Hyung Su ^a   Park, Gisung ^a   Lee, Sang Bum ^a   Yoon, Seokchan ^a   Kim, Jaisoon ^a   Lee, Jai Hyung ^a   An, Kyungwon ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

LASER BEAMS; LIGHTING; OPTICAL INSTRUMENT LENSES;

ENTRANCE PUPIL RADIUS; FULL WIDTH AT HALF-MAXIMUM; PINHOLE;

OPTICAL MICROSCOPY;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; CONFOCAL MICROSCOPY; ILLUMINATION; IMAGE ENHANCEMENT; LIGHT; METHODOLOGY; NORMAL DISTRIBUTION; RADIATION SCATTERING; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STATISTICAL MODEL;

ALGORITHMS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; LIGHT; LIGHTING; MICROSCOPY, CONFOCAL; MODELS, STATISTICAL; NORMAL DISTRIBUTION; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY;

EID: 33846590069     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.24.000060     Document Type: Article

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