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INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings

Volumn , Issue , 2010, Pages 478-479

Catalytic growth and characterization of single-crystalline aluminum nitride nanowires

(2) Wu, Hue Min a Liang, Jaw Yeu a

a CHINESE CULTURE UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALN NANOWIRE; CATALYTIC GROWTH; CHEMICAL VAPOR DEPOSITION METHODS; HIGH QUALITY; LATTICE PARAMETERS; RAMAN ANALYSIS; SCANNING ELECTRONS; SINGLE-CRYSTALLINE; SMOOTH SURFACE; UNIFORM NANOWIRES; VAPOR-LIQUID-SOLID GROWTH MECHANISM;

ALUMINUM NITRIDE; NANOELECTRONICS; NANOWIRES; NITRIDES; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SCANNING ELECTRON MICROSCOPY;

EID: 77951665103 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/INEC.2010.5424859 Document Type: Conference Paper

Times cited : (5)

References (6)

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