Recent patents on integrated software / hardware GMR - based systems and applications for PCB inspection

Recent Patents on Electrical Engineering

Volumn 2, Issue 2, 2009, Pages 82-91

  Megali, Giuseppe ^a   Cacciola, Matteo ^a   Pellicanò, Diego ^a   Morabito, Francesco C ^a  

^a UNIVERSITY MEDITERRANEA OF REGGIO CALABRIA   (Italy)

Author keywords

Crack detection; Eddy current testing; Giant magneto resistive; Magnetic sensors; Printed circuit board

Indexed keywords

CONDUCTING MATERIALS; EDDY CURRENT PROBES; GIANT MAGNETO RESISTIVE; INTEGRATED SOFTWARE; INTERDISCIPLINARY RESEARCH; MAGNETO RESISTIVE SENSORS; NON DESTRUCTIVE TESTING; PCB INSPECTION; SOFTWARE/HARDWARE;

CRACK DETECTION; EDDY CURRENTS; MAGNETIC SENSORS; MAGNETOS; PATENTS AND INVENTIONS; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE; PRINTED CIRCUIT TESTING;

EDDY CURRENT TESTING;

EID: 77951630383     PISSN: 18744761     EISSN: None     Source Type: Journal    
DOI: 10.2174/1874476110902020082     Document Type: Article

References (38)

1. Fert A, Grünberg P, Barthélémy A, Petroff F, Zinn W. Layered magnetic structures: Interlayer exchange coupling and giant magnetoresistance. J Magn Magn Mater 1995; 140(144): 1-8.
2. Baibich MN, Broto JM, Fert A, et al. Giant magnetoresistance of (001)Fe/(001)Cr magnetic superlattices. Phys Rev Lett 1988; 61(21): 2472-2475.
3. Binasch G, Grünberg P, Saurenbach F, Zinn W. Enhanced magnetoresistance in layered magnetic structures with antiferro-magnetic interlayer exchange. Phys Rev B 1989; 39(7): 4828-4830.
4. Dogaru T, Smith ST. Edge crack detection using a giant magneto-resistance based eddy current sensor. Non-Destruct Test Eval 2000; 16: 31-53.
5. Yamada S, Chomsuwan K, Iwahara M. Application of giant magnetoresistive sensor for nondestructive evaluation. IEEE Sens EXCO, Daegu, Korea 2006; 927-930.
6. Vogelgesang B, Bauer C, Rettig R. Performance of GMR-elements in sensors for automotive application, Advanced microsystem for automotive applications. In: Valldorf J, Gessner W, Eds. Springer Verlag 2005; 5-446.
7. Larrabee, R.D., Marchiando, J.F.: US5485080 (1996).
8. Dogaru T, Smith CH, Schneider RW, Smith ST. Deep crack detection around fastener holes in airplane multi-layered structures using GMR-based eddy current probes. Rev Prog QNDE 2004; 23: 398-405.
9. Grimberg R, Udpa L, Udpa S, Savin A. A novel rotating magnetic field eddy current transducer for the examination of fuel channels in PHWR nuclear power plants. Rev Prog QNDE 2005; 24: 471-478.
10. Wakiwaka H. Characteristics of giant magnetoresistance sensor and their application. J Magn Soc Jpn 2004; 28: 825-833.
11. Dogaru T, Smith ST. Giant magnetoresistance-based eddy-current sensor. IEEE Trans Magn 2001; 37: 3831-3838.
12. NVE Corporation. Introduction to NVE GMR sensors. Available: http://www.nve.com
13. Yamada S, Chomsuwan K, Fukuda Y, Iwahara M, Wakiwaka H, Shoji S. Eddy-current testing probe with spin-valve type GMR sensor for printed circuit board inspection. IEEE Trans Magn 2004; 40(4): 2676-2678.
14. Chomsuwan K, Yamada S, Iwahara M, Wakiwaka H, Shoji S. Application of eddy-current testing technique for high-density doublelayer printed circuit board inspection. IEEE Trans Magn 2005; 41(10): 3619-3621.
15. Yamada S, Chomsuwan K, Iwahara M, Wakiwaka H, Shoji S. PCB conductor dimension and alignment inspection with GMR based ECT probe. Rev Prog QNDE 2005; 24: 479-486.
16. Lenz J, Edelstein S. Magnetic sensors and their applications. IEEE Sens J 2006; 6(3): 631-649.
17. Mukhopadhyay SC. A novel planar mesh-type microelectro-magnetic sensor-Part I: Model formulation. IEEE Sens J 2004; 4(3): 301-307.
18. Mukhopadhyay SC. A novel planar mesh-type microelectro-magnetic sensor-Part II: Estimation of system properties. IEEE Sens J 2004; 4(3): 308-312.
19. Dogaru T, Smith ST. Giant magnetoresistance-based eddy-current sensor. IEEE Trans Magn 2001; 37(5): 3831-3838.
20. User's Manual Model SR844 RF Lock-in Amplifier Standford Research Systems, Inc., Sunnyvale, CA 1997; Rev. 2.5.
21. Bilik, Y., Keydar, E., Boroda, V.: WO2005047883A1 (2005).
22. Finarov, M.: US5333052 (1994).
23. Soiferman, J.: US5424633 (1995).
24. Kawaike, J., Ueda, K., Matsui, K.: US20056937035 (2005).
25. Spence, H.F., Burris, D. P., Houston, R.A.: US5440566 (1995).
26. Solferman, J.: US5424633 (1995).
27. Daalmans, G.: DE19757575 (1999).
28. Goulette, R.R., Xavier, S.K., Greenfield, R.L.: US5006788 (1991).
29. Kacprzak D, Yamada S, Iwahara M. Simulation of amplitude and phase characteristics during inspection of printed circuit board by eddy-current testing probe. Int J Appl Electromagn Mech 2001; 14(1-4): 15-19.
30. Bilik, Y., Keydar, E., Boroda, V.: US20056975108 (2005).
31. Hedengren, K.H.: US2005523727 (2005).
32. Young, J.D., Hedengren, K.H., Hurley, D.C.: US5182513 (1993).
33. Taylor, A.: US20026479989 (2002).
34. Tondra M, Popple A, Jander A, Millen RL, Pekas N, Porter MD. Microfabricated tools for manipulation and analysis of magnetic microcarriers. J Magn Magn Mater 2005; 293(1): 725-730.
35. Elshafiey I, Mohra A. GMR- and GMI-based systems for nondestructive evaluation of printed circuit board. J Circuits Syst Comp 2007; 16(6): 847-857.
36. Chomsuwan K, Yamada S, Iwahara M. Bare PCB inspection system with SV-GMR sensor eddy-current testing probe. IEEE Snenor J 2007; 7(5): 890-896.
37. Microchip Corporation. PIC16F685/687/689/690 Data Sheet. Available: ww1.microchip.com/downloads/en/devicedoc/41262A.pdf
38. MAXIM - Dallas Semiconductor. MAX232 Data Sheet. Available: http://www.datasheetcatalog.org/datasheet/maxim/MAX220-MAX249.pdf