Eddy-current testing probe with spin-valve type GMR sensor for printed circuit board inspection

IEEE Transactions on Magnetics

Volumn 40, Issue 4 II, 2004, Pages 2676-2678

  Yamada, S ^a   Chomsuwan, K ^a   Fukuda, Y ^a   Iwahara, M ^a   Wakiwaka, H ^b   Shoji, S ^c  

^a KANAZAWA UNIVERSITY   (Japan)

^b SHINSHU UNIVERSITY   (Japan)

^c TDK CORPORATION   (Japan)

Author keywords

Eddy current testing (ECT); Printed circuit board inspection; Signal to noise ratio; Spin valve giant magnetoresistance (SV GMR)

Indexed keywords

EDDY CURRENT TESTING; ELECTRIC CURRENTS; GIANT MAGNETORESISTANCE; MAGNETIC FIELDS; MAGNETIC FLUX; PROBES; SENSORS; SIGNAL TO NOISE RATIO; SOLENOIDS;

INDUCTIVE SENSORS; MAGNETIC SENSORS; PRINTED CIRCUIT BOARD INSPECTION; SPIN-VALVE GIANT MAGNETORESISTANCE (SV-GMR);

PRINTED CIRCUIT BOARDS;

EID: 4444246198     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.829254     Document Type: Article

References (4)

1. S. Yamada, K. Nakamura, M. Iwahara, T. Taniguchi, and H. Wakiwaka, "Application of ECT technique for inspection of bare PCB," IEEE Trans. Magn., vol. 39, pp. 3325-3327, Sept. 2003.
2. T. Taniguchi, D. Kacqrzak, S. Yamada, and M. Iwahara, "Wavelet-based processing of ECT Images for inspection of printed circuit board," IEEE Trans. Magn., vol. 37, pp. 2790-2793, July 2001.
3. D. Kacqrzak, T. Taniguchi, K. Nakamura, S. Yamada, and M. Iwahara, "Novel eddy current testing sensor for the inspection of printed circuit boards," IEEE Trans. Magn., vol. 37, pp. 2010-2012, July 2001.
4. T. Dogaru and S. T. Smith, "Giant magnetoresistance-based eddy-current sensor," IEEE Trans. Magn., vol. 37, pp. 3831-3838, Sept. 2001.