Dielectric functions and growth dynamics of Culn1-x,GA xSE2 absorber layers via in situ real time spectroscopic ellipsometry

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2009, Pages 001154-001156

  Walker, J D ^a   Khatri, H ^a   Ranjan, V ^a   Little, S ^a   Zartman, R ^a   Collins, R W ^a   Marsitlac, S ^a  

^a UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBER LAYERS; CHALCOPYRITE THIN FILMS; COPPER INDIUM GALLIUM DISELENIDE; DEVICE EFFICIENCY; DIELECTRIC FUNCTIONS; GROWTH DYNAMICS; IN-SITU; INDUSTRIAL SCALE; INITIAL STAGES; NON DESTRUCTIVE; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; TIME DEPENDENT;

COPPER COMPOUNDS; ELECTRONIC PROPERTIES; FEEDBACK; GALLIUM; INDIUM; OPTICAL PROPERTIES; SEMICONDUCTING SELENIUM COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE PROPERTIES; SURFACE ROUGHNESS;

FILM GROWTH;

EID: 77951581579     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2009.5411223     Document Type: Conference Paper

References (9)

1. I. Repins, M. A. Contreras, B. Egaas, C. DeHart, J. Scharf, C. L. Perkins, B. To, and R Noufi, Prog. Photovolt. 16, 235 (2008).
2. I. An, Y.M. Li, H.V. Nguyen, C.R. Wronski, and R.W. Collins, Appl. Phys. Lett. 59, 2543 (1991).
3. H. V. Nguyen, I. An, and R W. Collins, Phys. Rev. B 47, 3947 (1993).
4. P.D. Paulson, R.W. Birkmire, and W.N. Shafarman, J. Appl. Phys. 94, 879 (2003).
5. M.I. Alonso, K. Wakita, J. Pascual, M. Garriga, and N. Yamamoto, Phys. Rev. B 63, 075203 (2001).
6. T. Kawashima, S. Adachi, H. Miyake, and K. Sugiyama, J. Appl. Phys. 84, 5202 (1998).
7. M.I Alonso, M. Garriga, CA Durante Rincon, E. Hernandez, and M. Leon, Appl. Phys. A 74, 659 (2002).
8. M. I. Alonso, M. Garriga, C. A. Durante Rincon, and M. Leon, J. Appl. Phys. 88, 5796 (2000).
9. P. Lautenschlager, M. Garriga, S. Logothetidis, and M. Cardona, Phys. Rev. B 35, 9174 (1987).