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Applied Physics Letters

Volumn 96, Issue 15, 2010, Pages

Properties of a nanodielectric cryogenic resin

(4) Polizos, Georgios a Tuncer, Enis a Sauers, Isidor a More, Karren L a

a OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BREAKDOWN PROBABILITY; DIELECTRIC BREAKDOWNS; HIGH-VOLTAGE ENGINEERING; IN-SITU SYNTHESIZED; INSULATION THICKNESS; POLYMER CHAINS; TIO; VOLTAGE LEVELS;

CRYOGENICS; DIELECTRIC LOSSES; NANOPARTICLES; TITANIUM; TITANIUM DIOXIDE;

RESINS;

EID: 77951550142 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3394011 Document Type: Article

Times cited : (34)

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