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Volumn 38, Issue 2, 2005, Pages 223-234
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Structure-property relationship in dielectric mixtures: Application of the spectral density theory
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPOSITE MATERIALS;
COMPUTER SIMULATION;
DIELECTRIC PROPERTIES;
ELECTRIC IMPEDANCE;
ELLIPSOMETRY;
LIGHT SCATTERING;
PERCOLATION (SOLID STATE);
SPECTROSCOPY;
X RAYS;
BINARY COMPOSITES;
DIELECTRIC MIXTURES;
INTERFACIAL POLARIZATION;
SPECTRAL DENSITY;
DIELECTRIC MATERIALS;
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EID: 12844268577
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/38/2/006 Document Type: Conference Paper |
Times cited : (37)
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References (65)
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