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Volumn 53, Issue 1, 2010, Pages 77-82
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Microanalysis of artworks: IR microspectroscopy of paint cross-sections
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Author keywords
ATR microscopy; IR spectroscopy; Paint artwork; Synchrotron IR microscopy
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Indexed keywords
ATR MICROSCOPY;
ATTENUATED TOTAL REFLECTANCE;
COMMERCIAL BUILDING;
FTIR MICROSPECTROSCOPY;
HIGH QUALITY;
HIGH SPATIAL RESOLUTION;
IR MICRO-SPECTROSCOPY;
IR SOURCE;
IR SPECTROSCOPY;
LOCAL COMPOSITIONS;
LOW CONCENTRATIONS;
MICROSCOPE OBJECTIVE;
MINOR COMPONENTS;
PAINT LAYERS;
SPECTRAL SIGNATURE;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
GERMANIUM;
OFFICE BUILDINGS;
SYNCHROTRONS;
PAINT;
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EID: 77951209123
PISSN: 09242031
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vibspec.2010.01.021 Document Type: Article |
Times cited : (13)
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References (18)
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