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Volumn 5, Issue 11, 2008, Pages 3499-3502
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Tailoring WO3 thin layers using spray pyrolysis technique
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Author keywords
[No Author keywords available]
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Indexed keywords
AFM;
CHARACTERISATION;
CRYSTALLINE PARAMETERS;
CRYSTALLINE PROPERTIES;
DEPOSITION PARAMETERS;
DEPOSITION TECHNIQUE;
FILMS PROPERTIES;
INTERFACE PROPERTY;
OPTOELECTRONIC PROPERTIES;
SPRAY-PYROLYSIS TECHNIQUES;
THIN LAYERS;
XRD;
CONTACT ANGLE;
CRYSTALLINE MATERIALS;
DEPOSITION;
ELECTRONIC PROPERTIES;
GROWTH (MATERIALS);
NANOSTRUCTURES;
SURFACE TENSION;
SURFACE TOPOGRAPHY;
SURFACES;
SYNTHESIS (CHEMICAL);
THIN FILMS;
X RAY DIFFRACTION;
SPRAY PYROLYSIS;
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EID: 77951180656
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200779410 Document Type: Conference Paper |
Times cited : (27)
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References (18)
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