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Volumn 5, Issue 10, 2008, Pages 3405-3409
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The contact characteristics of Al p-GaSe Schottky diode
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Author keywords
[No Author keywords available]
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Indexed keywords
BARRIER HEIGHTS;
BRIDGMAN;
CONTACT CHARACTERISTICS;
CURRENT VOLTAGE;
HIGH TEMPERATURE;
IDEALITY FACTORS;
LAYERED SEMICONDUCTORS;
LOW TEMPERATURE REGIONS;
LOWER ENERGIES;
RICHARDSON PLOT;
SCHOTTKY BARRIERS;
SCHOTTKY DIODES;
TEMPERATURE RANGE;
ACTIVATION ENERGY;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DIODES;
SEMICONDUCTOR LASERS;
SEMICONDUCTOR SWITCHES;
TECHNICAL PRESENTATIONS;
CURRENT VOLTAGE CHARACTERISTICS;
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EID: 77951157633
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200878881 Document Type: Conference Paper |
Times cited : (7)
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References (13)
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