Determination of fluorine by total reflection X-ray fluorescence spectrometry

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 65, Issue 4, 2010, Pages 287-290

  Tarsoly, G ^a   Ovari M ^a   Zaray Gy ^a  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

Detection limit; Fluorine; Interference effects; Linearity range; TXRF

Indexed keywords

ANALYTICAL METHOD; ANALYTICAL PERFORMANCE; AQUEOUS MATRICES; CARRIER PLATES; CONCENTRATION LIMITS; DETECTION LIMIT; DETECTION LIMITS; FLUORESCENT RADIATION; INTERFERENCE EFFECTS; LINEAR RANGE; LINEARITY RANGE; LOW Z-ELEMENTS; MATRIX EFFECTS; QUANTIFICATION LIMIT; SILICON DRIFT DETECTOR; SILICONIZATION; TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRIES; ULTRA-THIN WINDOWS; VACUUM CHAMBERS;

BROMINE; CHLORINE; CHROMIUM; DETECTORS; ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; IODINE; LINEARIZATION; OXIDE MINERALS; PHOSPHORUS; QUARTZ; SILICONES; SPECTROMETRY; TRACE ELEMENTS; X RAY TUBES;

FLUORINE;

EID: 77951123780     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2010.02.019     Document Type: Article

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