Extracting extrinsic parameters of a laser scanner and a camera using EM

ICCAS-SICE 2009 - ICROS-SICE International Joint Conference 2009, Proceedings

Volumn , Issue , 2009, Pages 5269-5272

  Park, Jae Han ^a   Shin, Yong Deuk ^a   Park, Kyung Wook ^a   Baeg, Seung Ho ^a   Baeg, Moon Hong ^a  

^a Korea Institute of Industrial Technology   (South Korea)

Author keywords

Extrinsic calibration EM

Indexed keywords

3D LASER SCAN SYSTEM; CO-ORDINATE SYSTEM; COLORED MAPS; EXPECTATION-MAXIMIZATION ALGORITHMS; EXTRINSIC CALIBRATION; EXTRINSIC PARAMETER; LASER MEASUREMENTS; LASER SCANNER; MAP IMAGE; NOISY ENVIRONMENT; NOVEL METHODS; RIGID TRANSFORMATIONS; ROBUST ESTIMATION; SPATIAL DATA;

CALIBRATION; CAMERAS; COORDINATE MEASURING MACHINES; LASER APPLICATIONS; SCANNING;

THREE DIMENSIONAL;

EID: 77951095783     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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