Spectroscopic ellipsometry on photonic crystals made by self-assembled dye-doped P(S/HEMA) nanospheres

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 5, 2008, Pages 1403-1406

  Schutzmann, S ^a   Prosposito, P ^a   Casalboni, M ^a   Venditti, I ^b   Russo, M V ^b  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

^b SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG REFLECTION; DYE-DOPED; DYE-DOPED POLYMER; EFFECTIVE REFRACTIVE INDEX; FILLING FRACTIONS; GEOMETRICAL FEATURES; GLASS SUBSTRATES; NON DESTRUCTIVE; PHOTONIC STRUCTURE; REFERENCE MATERIAL; REFRACTIVE INDEX MODULATION; SCANNING ELECTRON MICROSCOPES; SELF-ASSEMBLED; STRUCTURAL CHARACTERIZATION;

LASER OPTICS; LIGHT REFRACTION; NANOSPHERES; POLYMERS; REFRACTIVE INDEX; REFRACTOMETERS; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ELLIPSOMETRY; SPONTANEOUS EMISSION; STYRENE; SUBSTRATES;

PHOTONIC CRYSTALS;

EID: 77951094360     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777779     Document Type: Conference Paper

References (19)

1. J. D. Joannapoulos, R. D. Meade, and J. N. Winn, Photonic Crystal: Molding the Flow of Light (Princeton University Press, Princeton, 1995).
2. G. Pan, R. Kesavamoorthy, and S. A. Asher, Phys. Rev. Lett.78, 3860 (1997).
3. S. I. Bozhevolny, V. S. Volkov, J. Arentoft, A. Boltasseva, T. Sondergaard, and M. Kristenses, Opt. Commun. 212, 51 (2002).
4. O. Painter, R. K. Lee, A. Scherer, A. Yariv, J. D. O'Brien, P. D. Dapkus, and I. Kim, Science 284, 1819 (1999).
5. J. F. Galisteo, F. Garcia-Santamaria, D. Golmayo, B. H. Jurez, C. Lopez, and E. Palacios, J. Opt. A: Pure Appl. Opt. 7, S244 (2005).
6. L. V. Woodcock, Nature 385, 141 (1997).
7. K. P. Velikov, T. van Dillen, A. Polman, and A. van Blaaderen, Appl. Phys. Lett. 81, 838 (2002).
8. G. Subramania, R. Biswas, K. Constant, M. M. Sigalas, and K. M. Ho, Phys. Rev. B 63, 235111 (2001).
9. G. M. Gajiev, V. G. Golubev, D. A. Kurdykov, A. V. Medvedev, A. B. Pevtsov, A. V. Sel'kin, and V. V. Travnikov, Phys. Rev. B 72, 205115 (2005).
10. H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (Wiley, Chichester, 2007).
11. M. Ahles, T. Ruhl, G. P. Hellmann, H. Winkler, R. Schmechel, and H. von Seggern, Opt. Commun. 246, 1 (2005).
12. M. Okubo, T. Suzuki, and Y. Fukuhara, Colloid. Polym. Sci. 281, 569 (2003).
13. C. Reese and S. Asher, J. Colloid Interface Sci. 248, 41 (2002).
14. R. D'Amato, I. Venditti, M.V. Russo, and M. Falconieri, J. Appl. Polym. Sci. 102, 4493 (2006).
15. C.-S. Chern and J.-C. Sheu, J. Polym. Sci. Part A: Polym. Chem. 38, 3188 (2000).
16. R. M. Almeida and S. Portal, Curr. Opin. Solid State Mater. Sci. 7, 151 (2003)
17. Y. A. Vlasov, M. A. Kaliteevski, and V. V. Nikolaev, Phys. Rev. B 60, 1555 (1999).
18. D. Poelman and P. F. Smet, J. Phys. D: Appl. Phys. 36, 1850 (2003).
19. S. Bosch, J. Ferré-Borrull, and J. Sancho-Parramon, Solid State Electron. 45, 703 (2001).