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Physica Status Solidi (A) Applications and Materials Science

Volumn 207, Issue 3, 2010, Pages 682-685

In situ measurements of surface (photo)voltage of roll-to-roll deposited thin film silicon solar cells

(6) Van Aken, Bas B a Bakker, Klaas J a Heijna, Maurits C R a Reid, Dennis b Baikie, Iain b Soppe, Wim J a

a TNO (Netherlands)

b KP TECHNOLOGY LTD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACTLESS MEASUREMENT; CONTROLLING SYSTEM; DOPED LAYERS; IN-LINE; IN-LINE MONITORING; IN-SITU; IN-SITU MEASUREMENT; KELVIN PROBE; NON DESTRUCTIVE; NON-CONTACT; PLASMA ZONE; ROLL TO ROLL; SI SOLAR CELLS; SILICON LAYER; SURFACE PHOTOVOLTAGES; THIN-FILM SILICON SOLAR CELLS; VIBRATING CAPACITORS; WORK-FUNCTION DIFFERENCE;

CHEMICAL VAPOR DEPOSITION; MONITORING; OPEN CIRCUIT VOLTAGE; PLASMA DEPOSITION; PROBES; SILICON SOLAR CELLS; SOLAR CELLS; THIN FILMS; VOLATILE ORGANIC COMPOUNDS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 77951012658 PISSN: 18626300 EISSN: 18626319 Source Type: Journal
DOI: 10.1002/pssa.200982741 Document Type: Article

Times cited : (6)

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