Contact between submicrometer silica spheres

Langmuir

Volumn 26, Issue 8, 2010, Pages 5583-5586

  Wang, Xiao Dong ^a   Shen, Zheng Xiang ^a   Zhang, Jin Long ^a   Jiao, Hong Fei ^a   Cheng, Xin Bin ^a   Ye, Xiao Wen ^a   Chen, Ling Yan ^a   Wang, Zhan Shan ^a  

^a TONGJI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION FORCES; CONTACT METHODS; CONTACT RADIUS; DEFORMATION MECHANISM; SEM; SILICA PARTICLE SIZE; SILICA PARTICLES; SILICA SPHERE; SUBMICROMETERS; SUBSTRATE CONTACT; VAN DER WAALS INTERACTIONS;

ELASTIC DEFORMATION; MICROMETERS; SCANNING ELECTRON MICROSCOPY; SILICA; VAN DER WAALS FORCES;

SPHERES;

MICROSPHERE; NANOSPHERE; SILICON DIOXIDE;

ARTICLE; CHEMISTRY; SCANNING ELECTRON MICROSCOPY; ULTRASTRUCTURE;

MICROSCOPY, ELECTRON, SCANNING; MICROSPHERES; NANOSPHERES; SILICON DIOXIDE;

EID: 77950962163     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la9038446     Document Type: Article

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