In situ measurements of plagioclase growth using SIMS depth profiles of 7Li/30Si: A means to acquire crystallization rates during short-duration decompression events

American Mineralogist

Volumn 95, Issue 4, 2010, Pages 592-601

  Genareau, Kimberly ^a   Clarke, Amanda B ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Decompression; Lithium; Plagioclase; SIMS; Soufri re Hills

Indexed keywords

CRYSTAL GROWTH; CRYSTALLIZATION; DEPTH PROFILING; LITHIUM; NUCLEATION; SECONDARY ION MASS SPECTROMETRY; UNDERCOOLING; VOLCANOES;

COMPRESSION EXPERIMENTS; CRYSTAL SIZE DISTRIBUTIONS; CRYSTALLIZATION RATES; DECOMPRESSION; EQUILIBRIUM COMPOSITIONS; INDUCED CRYSTALLIZATION; PLAGIOCLASE; PLAGIOCLASE PHENOCRYSTS;

FELDSPAR;

CRYSTALLIZATION; CRYSTALLOGRAPHY; DECOMPRESSION; IN SITU MEASUREMENT; LITHIUM; MASS SPECTROMETRY; PLAGIOCLASE;

LEEWARD ISLANDS [LESSER ANTILLES]; MONTSERRAT; SOUFRIERE HILLS VOLCANO;

EID: 77950902379     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2010.3292     Document Type: Article

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