Geochemical variations in late-stage growth of volcanic phenocrysts revealed by SIMS depth-profiling

American Mineralogist

Volumn 92, Issue 8-9, 2007, Pages 1374-1382

  Genareau, Kimberly ^a   Hervig, Richard ^a   Clarke, Amanda ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Montserrat; Phenocrysts; Plagioclase; SIMS depth profiling; Volcanic conduit

Indexed keywords

CRYSTALS; ELECTRON GUNS; FELDSPAR; FELDSPAR DEPOSITS; GASOLINE; GEOCHEMISTRY; ION BEAMS; MORPHOLOGY; SECONDARY ION MASS SPECTROMETRY; VOLCANIC ROCKS; VOLCANOES;

EXPERIMENTAL PETROLOGY; GEOCHEMICAL VARIATIONS; HOMOGENEOUS DISTRIBUTION; MONTSERRAT; PHENOCRYSTS; PLAGIOCLASE; SURFACE CONTAMINATIONS; VOLCANIC CONDUIT;

DEPTH PROFILING;

GEOCHEMISTRY; GROWTH; KINETICS; MAGMA; MAGMA CHAMBER; MASS SPECTROMETRY; NUCLEATION; PETROLOGY; PHENOCRYST; PLAGIOCLASE; VOLCANIC ERUPTION; VOLCANIC GLASS; VOLCANIC ROCK;

ATLANTIC ISLANDS; ATLANTIC OCEAN; CARIBBEAN ISLANDS; LEEWARD ISLANDS [LESSER ANTILLES]; LESSER ANTILLES; MONTSERRAT; SOUFRIERE HILLS VOLCANO;

EID: 38849103617     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2007.2468     Document Type: Article

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