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Volumn 6, Issue SUPPL. 1, 2009, Pages

Thickness control of coatings by means of modulated IR radiometry

Author keywords

Coatings; Deposition control; Modulated ir radiometry; Thermal properties; Thickness

Indexed keywords

COATING THICKNESS; COATINGS DEPOSITION; INVERSE SOLUTION; IR RADIOMETRY; MICROSCOPIC MEASUREMENT; NON DESTRUCTIVE; NON-CONTACT; PHASE LAGS; QUANTITATIVE INTERPRETATION; REACTIVE MAGNETRON SPUTTERING; SMOOTH SURFACE; THERMAL PROPERTIES; THERMAL TRANSPORT PROPERTIES; THERMAL WAVE; THERMAL WAVE METHOD; TWO-LAYER THERMAL WAVE PROBLEM;

EID: 77950839387     PISSN: 16128850     EISSN: 16128869     Source Type: Journal    
DOI: 10.1002/ppap.200931503     Document Type: Conference Paper
Times cited : (11)

References (9)
  • 3
    • 77954896562 scopus 로고    scopus 로고
    • The role of modulated IR radiometry measurements in the characterization of Zr-O-N thin films
    • F. Macedo, P. Carvalho, F. Vaz, J. Gibkes, B. K. Bein, J. Pelzl, The role of modulated IR radiometry measurements in the characterization of Zr-O-N thin films, in Proceedings of PSE 2008.
    • (2008) Proceedings of PSE
    • Macedo, F.1    Carvalho, P.2    Vaz, F.3    Gibkes, J.4    Bein, B.K.5    Pelzl, J.6
  • 5
    • 77954894607 scopus 로고    scopus 로고
    • CALOTEST® of CSM Instruments
    • CALOTEST® of CSM Instruments.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.