Optical and electrical properties of size-controlled Cu-7,7',8,8'- tetracyanoquinodimethane nanocrystals

Japanese Journal of Applied Physics

Volumn 49, Issue 1 Part 2, 2010, Pages

  Hiraishi, Kentaro ^a   Masuhara, Akito ^a   Kasai, Hitoshi ^a,b   Nakanishi, Hachiro ^a   Oikawa, Hidetoshi ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAPS; BLUE SHIFT; CHEMICAL REDUCTION; DIANIONS; ELEMENTAL ANALYSIS; INTER-BAND TRANSITION; LONG AXIS; MULTI-STEP; NEAR INFRARED REGION; OPTICAL AND ELECTRICAL PROPERTIES; RAMAN EXPERIMENTS; REPRECIPITATION METHODS; TETRACYANOQUINODIMETHANE; X-RAY PHOTOELECTRONS;

ELECTRIC CONDUCTIVITY; NANOCRYSTALS; SPECTROSCOPIC ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

OPTICAL PROPERTIES;

EID: 77950807441     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.49.01AE08     Document Type: Article

References (32)

1. R. S. Potember, T. O. Poehler, and D. O. Cowan: Appl. Phys. Lett. 34 (1979) 405.
2. R. Müller, S. D. Jonge, K. Myny, D. J. Wouters, J. Genoe, and P. Heremans: Appl, Phys. Lett. 89 (2006) 223501.
3. H. Wachtel, M. Ohnmacht, J. U. von Schütz, and H. C Wolf: Nanostruct. Mater. 6 (1995) 291
4. N. Gu, H.-Q. Zhang, Y. Wei, H.-Y. Shen, and L. Zhang: Supramol. Sci. 5 (1998) 691.
5. A. K. Neufeld, I. Madsen, A. M. Bond, and C F. Hogan: Chem. Mater. 15 (2003) 3573.
6. H. Liu, Q. Zhao, Y. Li, Y. Liu, F. Lu, J. Zhuang, S. Wang, L. Jiang, D. Zhu, D. Yu, and L. Chi: J. Am. Chem. Soc. 127 (2005) 1120.
7. A. R. Harris, A. K. Neufeld, A. P. O'Mullane, A. M. Bond, and R. J. S. Morrison: J. Electrochem. Soc. 152 (2005) C577.
8. K. Xiao, J. Tao, Z. Pan, A. A. Puretzky, I. N. Ivanov, S. J. Pennycook, and D. B. Geohegan: Angew. Chem., Int. Ed. 46 (2007) 2650.
9. X.-H. Zhou, S.-J. Wei, and S.-S. Zhang: Langmuir 24 (2008) 4464.
10. R. A. Heintz, H. Zhao, X. Ouyang, G. Grandinetti, J. Cowen, and K. R. Dunbar: Inorg. Chem. 38 (1999) 144.
11. J. Billen, S. Steudel, R. Müller, J. Genoe, and P. Heremans: Appl, Phys. Lett, 91 (2007) 263507.
12. R. Müller, S. D. Jonge, K. Myny, D. J. Wouters, J. Genoe, and P. Heremans: Solid-State Electron. 50 (2006) 601.
13. J. J. Hoagland, X. D. Wang, and K. W. Hipps: Chem. Mater. 5 (1993) 54.
14. S. Yamaguchi and R. S. Potember: Synth. Met. 78 (1996) 117.
15. R. S. Potember, T. O. Poehler, and R. C Benson: Appl, Phys. Lett. 41 (1982)548.
16. T. Oyamada, H. Tanaka, K. Matsushige, H. Sasabe, and C Adachi: Appl, Phys. Lett. 83 (2003) 1252.
17. K. Xiao, I. N. Ivanov, A. A. Puretzky, Z. Liu, and D. B. Geohegan: Adv. Mater. 18(2006)2184.
18. T. Kever, C Nauenheim, U. Böttger, and R. Waser: Thin Solid Films 515 (2006) 1893.
19. H. Duan, D. O. Cowan, and J. J. Kruger: Electrochem. Soc. 140 (1993) 2807.
20. S.-G. Liu, Y.-Q. Liu, P.-J. Wu, and D.-B. Zhu: Chem. Mater. 8 (1996) 2779.
21. ) Y. Liu, Z. Ji, Q. Tang, L. Jiang, H. Li, M. He, W. Hu, D. Zhang, L. Jiang, X. Wang, C Wang, Y. Liu, and D. Zhu: Adv. Mater. 17 (2005) 2953.
22. A. P. O'Mullane, N. Fay, A. Nafady, and A. M. Bond: J. Am. Chem. Soc. 129 (2007) 2066.
23. A. K. Neufeld, A. P. O'Mullane, and A. M. Bond: J. Am. Chem. Soc. 127 (2005) 13846.
24. R. Muller, J. Genoe, and P. Heremans: Appl. Phys. Lett. 88 (2006) 242105.
25. A. R. Harris, A. K. Neut'eld, A. P. O'Mullane, and A. M. Bond: J. Mater. Chem. 16 (2006) 4397.
26. K. Hiraishi, A. Masuhara, T. Yokoyama, H. Kasai, H. Nakanishi, and H. Oikawa: J. Cryst. Growth 311 (2009) 948.
27. M. S. Khatkale and J. P. Devlin: J. Chem. Phys. 70 (1979) 1851.
28. R. Bozio, A, Girlando, and C Pecile: J. Chem. Soc, Faraday Trans. 2 71 (1975) 1237.
29. S.-G. Liu, Y.-Q. Liu, and D.-B. Zhu: Thin Solid Films 280 (1996) 271.
30. Y. Iida: Bull. Chem, Soc. Jpn. 42 (1969) 71.
31. D. A. Lowitz: J. Chem. Phys. 46 (1967) 4698.
32. J. Taue: Mater. Res. Bull, 5 (1970) 721,