Frustration of direct photoionizations of rare gas clusters in intense extreme ultraviolet free-electron laser pulses

Journal of Physics: Conference Series

Volumn 212, Issue , 2010, Pages

  Iwayama, H ^a,g   Nagaya, K ^a,g   Murakami, H ^a,g   Yao, M ^a,g   Fukuzawa, H ^b,g   Liu, X J ^b,g   Prumper G ^b,g   Okunishi, M ^b   Shimada, K ^b   Ueda, K ^b,g   Harada, T ^b   Toyoda, M ^b   Yanagihara, M ^b   Yamamoto, M ^b   Motomura, K ^b,g   Saito, N ^c,g   Rudenko, A ^d,g   Ullrich, J ^d,e,g   Foucar, L ^f,g   Czasch, A ^f   Dorner R ^f   Nagasono, M ^g   Higashiya, A ^g   Yabashi, M ^g   Ishikawa, T ^g   Ohashi, H ^g,h   Kimura, H ^g,h   Togashi, T ^g   more..

^a KYOTO UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^d Max Planck Advanced Study Group Within CFEL   (Germany)

^e MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

^f GOETHE UNIVERSITY   (Germany)

^g RIKEN   (Japan)

^h JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON LASERS; FREE ELECTRON LASERS; IONIZATION; IONIZATION OF GASES; IONS; KINETIC ENERGY; KINETICS; LASER PULSES; PHOTOIONIZATION; PHOTONS; ULTRAVIOLET LASERS;

COULOMB EXPLOSION; EXTREME-ULTRAVIOLET FREE-ELECTRON LASERS; ION KINETIC ENERGY; MOMENTUM IMAGING; MULTIPLE IONIZATION; PHOTO-ELECTRON EMISSION; RARE-GAS CLUSTERS; SIZE DEPENDENCE;

ELECTRONS;

EID: 77950798325     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/212/1/012014     Document Type: Conference Paper

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