Systematic comparison of eight substrates in the growth of FeSe 0.5Te0.5 superconducting thin films

Applied Physics Express

Volumn 3, Issue 4, 2010, Pages

  Imai, Yoshinori ^a,d   Akiike, Takanori ^a,d   Hanawa, Masafumi ^b,d   Tsukada, Ichiro ^b,d   Ichinose, Ataru ^b,d   Maeda, Atsutaka ^a,d   Hikage, Tatsuo ^c   Kawaguchi, Takahiko ^c,d   Ikuta, Hiroshi ^c,d  

^a UNIVERSITY OF TOKYO   (Japan)

^b CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY   (Japan)

^c NAGOYA UNIVERSITY   (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS-LIKE; DIFFERENT SUBSTRATES; IN-PLANE ORIENTATION; LATTICE-PARAMETER RATIO; SUBSTRATE SURFACE; SUPERCONDUCTING PROPERTIES; SUPERCONDUCTING THIN FILM; TRANSMISSION ELECTRON MICROSCOPY OBSERVATION;

AMORPHOUS FILMS; LATTICE MISMATCH; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SUPERCONDUCTIVITY; TELLURIUM COMPOUNDS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

SUPERCONDUCTING FILMS;

EID: 77950651910     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.3.043102     Document Type: Article

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