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Volumn 122, Issue 1, 2010, Pages 250-258
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Electrical conductivity, Seebeck coefficient, and defect structure of oxygen nonstoichiometric Nd2-xSrxNiO4+δ
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Author keywords
Electrical conductivity; K2NiF4 type oxides; Nd2NiO4; Seebeck coefficient
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Indexed keywords
BAND CONDUCTION;
CONDUCTION MECHANISM;
ELECTRICAL CONDUCTIVITY;
ENERGY LEVEL;
FREE HOLES;
HIGH TEMPERATURE;
K2NIF4 TYPE OXIDES;
METALLIC CONDUCTION;
NON-STOICHIOMETRIC OXYGEN;
NONSTOICHIOMETRIC;
ORBITALS;
OXYGEN PARTIAL PRESSURE;
SEMI-QUANTITATIVE ANALYSIS;
TEMPERATURE INCREASE;
DEFECTS;
ELECTRIC CONDUCTIVITY;
HOLE MOBILITY;
NEODYMIUM;
OXIDES;
OXYGEN;
SEEBECK COEFFICIENT;
HOLE CONCENTRATION;
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EID: 77950517680
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matchemphys.2010.02.044 Document Type: Article |
Times cited : (30)
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References (28)
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