The Effect of Defect Structure on Electrical Conductivity and Thermoelectric Power of La2-xSrxCuO4-δ at High Temperatures

Electrochemistry

Volumn 68, Issue 6, 2000, Pages 507-514

  Kanai, Hideki ^a   Hashimoto, Takuya ^b   Tagawa, Hiroaki ^a   Mizusaki, Junichiro ^c  

^a YOKOHAMA NATIONAL UNIVERSITY   (Japan)

^b NIHON UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

Conduction Mechanism; Electrical Conductivity; La2 xSrxCuO4 ; Seebeck Coefficient

Indexed keywords

EID: 0345853384     PISSN: 13443542     EISSN: None     Source Type: Journal    
DOI: 10.5796/electrochemistry.68.507     Document Type: Article

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