Surface relaxation in Cu(4 1 0)-O: A medium energy ion scattering study

Surface Science

Volumn 604, Issue 9-10, 2010, Pages 788-796

  Sheppard, D C ^a   Parkinson, G S ^a   Hentz, A ^a   Quinn, P D ^a   Munoz Marquez M A ^a   Woodruff, D P ^a   Bailey, P ^b   Noakes, T C Q ^b  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

Author keywords

Copper; Medium energy ion scattering (MEIS); Oxygen; Surface relaxation; Vicinal single crystal surfaces

Indexed keywords

CU ATOMS; CU(1 0 0); DENSITY FUNCTIONAL THEORY CALCULATIONS; MEASUREMENT AND SIMULATION; MEDIUM ENERGY ION SCATTERING; MISSING ROW; OXYGEN SURFACE; RELAXATION MODELS; SCATTERING GEOMETRIES; SCATTERING PLANE; STEPPED SURFACES; STRUCTURAL PARAMETER; VICINAL SINGLE CRYSTAL SURFACE;

CRYSTAL ATOMIC STRUCTURE; DENSITY FUNCTIONAL THEORY; IONS; OXYGEN; PHASE INTERFACES; PLASMA INTERACTIONS; SCATTERING; SOIL CONSERVATION; SURFACE RELAXATION; X RAY DIFFRACTION;

SINGLE CRYSTAL SURFACES;

EID: 77950517509     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2010.02.001     Document Type: Article

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