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Volumn 516, Issue 1-2, 2002, Pages 16-32

Structure determination of Cu(4 1 0)-O using X-ray diffraction and DFT calculations

(11) Vlieg, E a,b Driver, S M c Goedtkindt, P b Knight, P J c Liu, W d Ludecke J c Mitchell, K A R d Murashov, V d Robinson, I K e De Vries, S A b Woodruff, D P c

a RADBOUD UNIVERSITY NIJMEGEN (Netherlands)

b FOM INSTITUTE AMOLF (Netherlands)

c UNIVERSITY OF WARWICK (United Kingdom)

d UNIVERSITY OF BRITISH COLUMBIA (Canada)

e University of Illinois at Urbana Champaign (United States)

Author keywords

Chemisorption; Copper; Oxygen; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography; Vicinal single crystal surfaces; X ray scattering, diffraction, and reflection

Indexed keywords

ADSORPTION; CHEMICAL BONDS; CHEMISORPTION; COPPER; MONOLAYERS; OXYGEN; PROBABILITY DENSITY FUNCTION; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

DENSITY FUNCTIONAL THEORY (DFT); SURFACE RELAXATIONS;

SURFACE TOPOGRAPHY;

EID: 0037056211 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(02)02066-6 Document Type: Article

Times cited : (25)

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