Exchange bias by implantation of O ions into Co thin films

Applied Physics Letters

Volumn 96, Issue 13, 2010, Pages

  Demeter, J ^a   Meersschaut, J ^a   Almeida, F ^a   Brems, S ^b   Van Haesendonck, C ^b   Teichert, A ^a,b,c   Steitz, R ^c   Temst, K ^a   Vantomme, A ^a  

^a KU LEUVEN   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; CO FILMS; CO THIN FILMS; CO-MATRIX; EXCHANGE BIAS; EXCHANGE BIAS EFFECTS; MAGNETIZATION REVERSAL MECHANISMS; NOBLE GAS; OXYGEN IONS; SURFACE OXIDATIONS;

INERT GASES; MAGNETIZATION REVERSAL; OXIDATION; OXYGEN;

COBALT;

EID: 77950488549     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3377907     Document Type: Article

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