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Volumn E92-C, Issue 8, 2009, Pages 1013-1019

Contact area analysis by FEM with plating layer for electrical contact

Author keywords

Contact load; Contact resistance; Electrical contact; FEM analysis; Plating

Indexed keywords

ELECTRIC CONTACTS; FINITE ELEMENT METHOD; PLATING;

EID: 77950456827     PISSN: 09168524     EISSN: 17451353     Source Type: Journal    
DOI: 10.1587/transele.E92.C.1013     Document Type: Article
Times cited : (9)

References (14)
  • 4
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    • Experimental consideration for the contact resistance mechanism
    • M. Tukamoto, K. Sano, and H. Fujimaki, "Experimental consideration for the contact resistance mechanism, " Yazaki Technical Report, vol. 20, pp. 75-79, 1996.
    • (1996) Yazaki Technical Report , vol.20 , pp. 75-79
    • Tukamoto, M.1    Sano, K.2    Fujimaki, H.3
  • 10
    • 77950403933 scopus 로고    scopus 로고
    • Effect of inelastic material constants on vickers hardness
    • A. Hirano, M. Sakane, and N. Hamada, "Effect of inelastic material constants on vickers hardness, " Proc. 2004 Annual Meeting of JSME/MMD, vol. 2004, pp. 583-584, 2004.
    • (2004) Proc. 2004 Annual Meeting of JSME/MMD , vol.2004 , pp. 583-584
    • Hirano, A.1    Sakane, M.2    Hamada, N.3
  • 11
    • 73649133397 scopus 로고    scopus 로고
    • The effect of plating and contact shape in electric contact on contact resistance
    • S. Sawada, K. Shimizu, Y. Hattori, Y. Saitoh, T. Tamai, and K. Iida, "The effect of plating and contact shape in electric contact on contact resistance, " Proc. ICEC 24th, pp. 257-261, 2008.
    • (2008) Proc. ICEC 24th , pp. 257-261
    • Sawada, S.1    Shimizu, K.2    Hattori, Y.3    Saitoh, Y.4    Tamai, T.5    Iida, K.6
  • 14
    • 77950454373 scopus 로고    scopus 로고
    • Prediction of resistance of electric contact with plated layer (1): Theoretical analyses
    • S. Sawada, K. Shimizu, Y. Hattori, and T. Tamai, "Prediction of resistance of electric contact with plated layer (1): Theoretical analyses, " IEICE Technical Report, EMD, 108 (296), pp. 93-96, 2008.
    • (2008) IEICE Technical Report, EMD , vol.108 , Issue.296 , pp. 93-96
    • Sawada, S.1    Shimizu, K.2    Hattori, Y.3    Tamai, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.