General mechanism involved in subwavelength optics of conducting microstructures: Charge-oscillation-induced light emission and interference

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 27, Issue 4, 2010, Pages 718-729

  Huang, Xian Rong ^a,b   Peng, Ru Wen ^c  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE DENSITY; CHARGE DENSITY WAVES; ELECTRONS; LIGHT SCATTERING; LIGHT SOURCES; MICROSTRUCTURE; PERIODIC STRUCTURES; PLASMONS;

CHARGE OSCILLATION; CLASSICAL SURFACES; CONDUCTING SURFACES; EVANESCENT WAVE; GEOMETRICAL EFFECT; NANO-OPTICAL DEVICES; STRUCTURED SURFACES; SUBWAVELENGTH OPTICS;

LIGHT;

EID: 77950425367     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.27.000718     Document Type: Article

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